Dynamic Statistical-Timing-Analysis-Based VLSI Path Delay Test Pattern Generation
نویسندگان
چکیده
منابع مشابه
Efficient algorithms for fundamental statistical timing analysis problems in delay test applications of VLSI circuits
xvii German Abstract — Zusammenfassung xix
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ژورنال
عنوان ژورنال: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
سال: 2015
ISSN: 1063-8210,1557-9999
DOI: 10.1109/tvlsi.2014.2352937